Collocated Z-axis control of a high-speed nanopositioner for video-rate atomic force microscopy

- Yong, Yuen Kuan, Moheimani, S. O. Reza

Temperature control for nano-scale films by spatially-separated atomic layer deposition based on generalized predictive control

- He, Wen-Jie, Zhang, Hai-Tao, Chen, Zhiyong, Lin, Ji-Long, Tian, Kan, Shan, Bin, Chen, Rong

Direct tip-sample force estimation for high-speed dynamic mode atomic force microscopy

- Karvinen, Kai S., Ruppert, Michael G., Mahata, Kaushik, Moheimani, S. O. R.

Video-rate lissajous-scan atomic force microscopy

- Yong, Yuen Kuan, Bazaei, Ali, Moheimani, S. O. Reza

Design of an inertially counterbalanced z-nanopositioner for high-speed atomic force microscopy

- Yong, Y. K., Mohemani, S. O. R.

A switched gain resonant controller to minimize image artifacts in intermittent contact mode atomic force microscopy

- Fairbairn, Matthew W., Moheimani, S. O. Reza

A new scanning method for fast atomic force microscopy

- Mahmood, Iskandar A., Moheimani, S. O. Reza, Bhikkaji, Bharath

A new method for robust damping and tracking control of scanning probe microscope positioning stages

- Fleming, Andrew J., Aphale, Sumeet S., Moheimani, S. O. Reza

Design, identification, and control of a flexure-based XY stage for sast nanoscale positioning

- Yong, Yuen Kuan, Aphale, Sumeet S., Moheimani, S. O. Reza

Achieving subnanometer precision in a MEMS-based storage device during self-servo write process

- Sebastian, Abu, Pantazi, Angeliki, Moheimani, S. O. Reza, Pozidis, Haris, Eleftheriou, Evangelos

Minimizing scanning errors in piezoelectric stack-actuated nanopositioning platforms

- Aphale, Sumeet S., Bhikkaji, Bharath, Moheimani, S. O. Reza